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Journal: SensorsVolume: 21Number: 5627
Article: Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests
  • Authors:
  • Fabio Principato1,*,
  • Giuseppe Allegra2 and
  • Corrado Cappello2
  • et al.
Link: https://www.mdpi.com/1424-8220/21/16/5627

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