Wang, Q.; Yu, Y.; Ahmed, H.O.A.; Darwish, M.; Nandi, A.K.
Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method. Sensors 2021, 21, 4159.
https://doi.org/10.3390/s21124159
AMA Style
Wang Q, Yu Y, Ahmed HOA, Darwish M, Nandi AK.
Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method. Sensors. 2021; 21(12):4159.
https://doi.org/10.3390/s21124159
Chicago/Turabian Style
Wang, Qinghua, Yuexiao Yu, Hosameldin O. A. Ahmed, Mohamed Darwish, and Asoke K. Nandi.
2021. "Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method" Sensors 21, no. 12: 4159.
https://doi.org/10.3390/s21124159
APA Style
Wang, Q., Yu, Y., Ahmed, H. O. A., Darwish, M., & Nandi, A. K.
(2021). Open-Circuit Fault Detection and Classification of Modular Multilevel Converters in High Voltage Direct Current Systems (MMC-HVDC) with Long Short-Term Memory (LSTM) Method. Sensors, 21(12), 4159.
https://doi.org/10.3390/s21124159