Next Article in Journal
Investigating the Use of Pretrained Convolutional Neural Network on Cross-Subject and Cross-Dataset EEG Emotion Recognition
Next Article in Special Issue
Evanescent-Wave Fiber Optic Sensing of the Anionic Dye Uranine Based on Ion Association Extraction
Previous Article in Journal
Wearable Cardiorespiratory Monitoring Employing a Multimodal Digital Patch Stethoscope: Estimation of ECG, PEP, LVET and Respiration Using a 55 mm Single-Lead ECG and Phonocardiogram
Previous Article in Special Issue
The Field Monitoring Experiment of the Roof Strata Movement in Coal Mining Based on DFOS
Open AccessArticle

Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure

by Zheyu Wu 1,†, Bin Liu 2,†, Jiangfeng Zhu 1,*, Juan Liu 2, Shengpeng Wan 2, Tao Wu 2 and Jinghua Sun 3
1
School of Physics and Optoelectronic Engineering, Xidian University, Xi’an 710071, China
2
National Engineering Laboratory for Destructive Testing and Optoelectronic Sensing Technology and Application, Nanchang Hang Kong University, Nanchang 330063, China
3
Sch Elect Engn & Intelligentizat, Dongguan University of Technology, Dongguan 523808, China
*
Author to whom correspondence should be addressed.
These authors contributed equally to this work.
Sensors 2020, 20(7), 2035; https://doi.org/10.3390/s20072035
Received: 7 February 2020 / Revised: 19 March 2020 / Accepted: 1 April 2020 / Published: 4 April 2020
(This article belongs to the Special Issue Optical Fiber Sensors and Photonic Devices)
An ultrahigh resolution thickness measurement sensor was proposed based on a single mode–hollow core–single mode (SMF–HCF–SMF) fiber structure by coating a thin layer of material on the HCF surface. Theoretical analysis shows that the SMF–HCF–SMF fiber structure can measure coating thickness down to sub-nanometers. An experimental study was carried out by coating a thin layer of graphene oxide (GO) on the HCF surface of the fabricated SMF–HCF–SMF fiber structure. The experimental results show that the fiber sensor structure can detect a thin layer with a thickness down to 0.21 nanometers, which agrees well with the simulation results. The proposed sensing technology has the advantages of simple configuration, ease of fabrication, low cost, high resolution, and good repeatability, which offer great potential for practical thickness measurement applications. View Full-Text
Keywords: optical fiber sensing; hollow core optical fiber; graphene oxide (GO); thickness measurement optical fiber sensing; hollow core optical fiber; graphene oxide (GO); thickness measurement
Show Figures

Figure 1

MDPI and ACS Style

Wu, Z.; Liu, B.; Zhu, J.; Liu, J.; Wan, S.; Wu, T.; Sun, J. Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure. Sensors 2020, 20, 2035.

Show more citation formats Show less citations formats
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Search more from Scilit
 
Search
Back to TopTop