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Open AccessArticle

In-Situ Measurement of Electrical-Heating-Induced Magnetic Field for an Atomic Magnetometer

1
Research Institute for Frontier Science, Beihang University, Beijing 100191, China
2
Hangzhou Innovation Institute, Beihang University, Hangzhou 310051, China
3
School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China
*
Author to whom correspondence should be addressed.
Sensors 2020, 20(7), 1826; https://doi.org/10.3390/s20071826
Received: 19 February 2020 / Revised: 20 March 2020 / Accepted: 24 March 2020 / Published: 25 March 2020
(This article belongs to the Section Physical Sensors)
Electrical heating elements, which are widely used to heat the vapor cell of ultrasensitive atomic magnetometers, inevitably produce a magnetic field interference. In this paper, we propose a novel measurement method of the amplitude of electrical-heating-induced magnetic field for an atomic magnetometer. In contrast to conventional methods, this method can be implemented in the atomic magnetometer itself without the need for extra magnetometers. It can distinguish between different sources of magnetic fields sensed by the atomic magnetometer, and measure the three-axis components of the magnetic field generated by the electrical heater and the temperature sensor. The experimental results demonstrate that the measurement uncertainty of the heater’s magnetic field is less than 0.2 nT along the x-axis, 1.0 nT along the y-axis, and 0.4 nT along the z-axis. The measurement uncertainty of the temperature sensor’s magnetic field is less than 0.02 nT along all three axes. This method has the advantage of measuring the in-situ magnetic field, so it is especially suitable for miniaturized and chip-scale atomic magnetometers, where the cell is extremely small and in close proximity to the heater and the temperature sensor. View Full-Text
Keywords: electrical heating; in-situ measurement; atomic magnetometer; spin-exchange relaxation-free electrical heating; in-situ measurement; atomic magnetometer; spin-exchange relaxation-free
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MDPI and ACS Style

Lu, J.; Wang, J.; Yang, K.; Zhao, J.; Quan, W.; Han, B.; Ding, M. In-Situ Measurement of Electrical-Heating-Induced Magnetic Field for an Atomic Magnetometer. Sensors 2020, 20, 1826.

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