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Open AccessArticle

Optical Thickness Monitoring as a Strategic Element for the Development of SPR Sensing Applications

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Centro de Investigaciones en Óptica AC, Div. de Fotónica, Loma del Bosque 115, Col. Lomas del Campestre C.P. 37150, León, Gto, Mexico
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Universidad Tecnológica de León, Electromecánica Industrial, Blvd. Universidad Tecnológica #225, Col. San Carlos C.P. 37670, León, Gto, Mexico
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Universidad Autónoma de Nuevo León, Facultad de Ciencias Químicas. Av. Universidad S/N Ciudad Universitaria, San Nicolás de los Garza C.P. 66455, Nuevo León, Mexico
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Centro de Investigación en Biotecnología y Nanotecnología (CIByN), Facultad de Ciencias Químicas, Universidad Autónoma de Nuevo León. Parque de Investigación e Innovación Tecnológica, Km. 10 autopista al Aeropuerto Internacional Mariano Escobedo, Apodaca 66629, Nuevo León, Mexico
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Author to whom correspondence should be addressed.
Sensors 2020, 20(7), 1807; https://doi.org/10.3390/s20071807
Received: 27 February 2020 / Revised: 20 March 2020 / Accepted: 23 March 2020 / Published: 25 March 2020
(This article belongs to the Special Issue Optical–Resonant Microsensors)
The importance of the monitoring of thickness and rate deposition is indispensable for the fabrication of thin film sensors, such as SPR sensors. The sensitivity of SPR responses varies with the thickness of the film, as well as the linear range. Thus, in the present work, we presented an experimental study of the plasmonic response of Cr/Au thin films deposited onto glass slides by evaporation, based on both a rotation and no-rotation system. The results show that the thickness of the gold film varies from 240 to 620 Å, depending on the glass slide position. The SPR response curves obtained experimentally were compared with simulated plasmonic responses and different parameters such as resonance angle, and the depth, slope and half-width of the SPR curve were analysed. View Full-Text
Keywords: surface plasmon resonance; optical constant; thin-film coating; optical properties of surfaces; biosensor surface plasmon resonance; optical constant; thin-film coating; optical properties of surfaces; biosensor
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MDPI and ACS Style

Luna-Moreno, D.; Sánchez-Álvarez, A.; Rodríguez-Delgado, M. Optical Thickness Monitoring as a Strategic Element for the Development of SPR Sensing Applications. Sensors 2020, 20, 1807.

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