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Journal: Sensors, 2020
Volume: 20
Number: 7305
Article:
Application of Deep and Machine Learning Using Image Analysis to Detect Fungal Contamination of Rapeseed
Authors:
by
Krzysztof Przybył, Jolanta Wawrzyniak, Krzysztof Koszela, Franciszek Adamski and Marzena Gawrysiak-Witulska
Link:
https://www.mdpi.com/1424-8220/20/24/7305
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