Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers
Department of Electrical, Electronic and Information Engineering, Guglielmo Marconi Alma Mater Studiorum, University of Bologna, Viale del Risorgimento 2, 40136 Bologna, Italy
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Sensors 2020, 20(14), 4061; https://doi.org/10.3390/s20144061
Received: 24 June 2020
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Revised: 15 July 2020
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Accepted: 19 July 2020
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Published: 21 July 2020
(This article belongs to the Section Electronic Sensors)
The scenario of instrument transformers has radically changed from the introduction of the Low-Power version, both passive and active. The latter type, typically referred to as Electronic Instrument Transformers (EITs), has no dedicated standard within the IEC 61869 series yet. To this purpose, in the authors’ opinion, it is worth understanding how the limits of typical disturbances affecting EITs should be standardized. In particular, after a brief review of the standards, the work presented a mathematical approach to determine the sources of signal disturbances influence, which affect the rms value, on the ratio error. From the results, we discussed that the emergence of disturbances generated within the EIT is a critical aspect to be studied with data of typical off-the-shelf devices. Therefore, to guarantee a correct operation of the devices, a proper standardization of the sources of disturbance should be provided.
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MDPI and ACS Style
Mingotti, A.; Peretto, L.; Tinarelli, R. Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers. Sensors 2020, 20, 4061. https://doi.org/10.3390/s20144061
AMA Style
Mingotti A, Peretto L, Tinarelli R. Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers. Sensors. 2020; 20(14):4061. https://doi.org/10.3390/s20144061
Chicago/Turabian StyleMingotti, Alessandro, Lorenzo Peretto, and Roberto Tinarelli. 2020. "Toward the Standardization of Limits to Offset and Noise in Electronic Instrument Transformers" Sensors 20, no. 14: 4061. https://doi.org/10.3390/s20144061
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