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        Journal: Sensors, 2020
        Volume: 20 
                	Number: 3626 
                
        
        Article:
        An Infrared Defect Sizing Method Based on Enhanced Phase Images 
        Authors: 
       	by
                    Yanjie Wei, Zhilong Su, Shuangshuang Mao and Dongsheng Zhang        
        Link:
        https://www.mdpi.com/1424-8220/20/13/3626
        
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