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Journal: Sensors, 2020
Volume: 20
Number: 3626
Article:
An Infrared Defect Sizing Method Based on Enhanced Phase Images
Authors:
by
Yanjie Wei, Zhilong Su, Shuangshuang Mao and Dongsheng Zhang
Link:
https://www.mdpi.com/1424-8220/20/13/3626
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