Next Article in Journal
JLVEA: Lightweight Real-Time Video Stream Encryption Algorithm for Internet of Things
Previous Article in Journal
A Survey of IoT Security Based on a Layered Architecture of Sensing and Data Analysis
Previous Article in Special Issue
A Stand-Alone Smart Camera System for Online Post-Earthquake Building Safety Assessment
Open AccessArticle

An Infrared Defect Sizing Method Based on Enhanced Phase Images

1
Shanghai Institute of Applied Mathematics and Mechanics, School of Mechanics and Engineering Science, Shanghai University, Shanghai 200444, China
2
Shanghai Key Laboratory of Mechanics in Energy Engineering, Shanghai University, Shanghai 200072, China
*
Author to whom correspondence should be addressed.
Sensors 2020, 20(13), 3626; https://doi.org/10.3390/s20133626
Received: 22 May 2020 / Revised: 23 June 2020 / Accepted: 24 June 2020 / Published: 28 June 2020
(This article belongs to the Special Issue Sensors for Structural Damage Identification)
Infrared thermography (IRT) is a full-field, contactless technique that has been widely used for nondestructive evaluation of structural materials due to many advantages. One of the major limitations of IRT is the fuzzy edge and low contrast in the inspected images—as well as the cost of the system. An efficient image post-processing with an affordable and portable device is of great interest to the engineering society. In this study, a convenient and economical inspection system using common halogen lamps was constructed. The corresponding image-processing scheme, which includes Fourier phase analysis and specific image enhancement was developed to identify defects with sharp and clear edges and good contrast. This system was applied to localized of defects in glass-fiber-reinforced composite panels. The results showed that defects with an effective diameter as small as 5 mm can be detected with excellent image quality. As a conclusion, the developed system provides an economic alternative to traditional infrared thermography which is able to identify defects with good qualities. View Full-Text
Keywords: infrared thermography; image enhancement; composite structures infrared thermography; image enhancement; composite structures
Show Figures

Figure 1

MDPI and ACS Style

Wei, Y.; Su, Z.; Mao, S.; Zhang, D. An Infrared Defect Sizing Method Based on Enhanced Phase Images. Sensors 2020, 20, 3626.

Show more citation formats Show less citations formats
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

1
Search more from Scilit
 
Search
Back to TopTop