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Journal: Sensors, 2020
Volume: 20
Number: 287
Article:
Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process
Authors:
by
Célestin Doyen, Stéphane Ricq, Pierre Magnan, Olivier Marcelot, Marios Barlas and Sébastien Place
Link:
https://www.mdpi.com/1424-8220/20/1/287
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