Conca Parra, A.;                     Casper, F.;                     Paul, J.;                     Lehndorff, R.;                     Haupt, C.;                     Jakob, G.;                     Kläui, M.;                     Hillebrands, B.    
        Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions. Sensors 2019, 19, 583.
    https://doi.org/10.3390/s19030583
    AMA Style
    
                                Conca Parra A,                                 Casper F,                                 Paul J,                                 Lehndorff R,                                 Haupt C,                                 Jakob G,                                 Kläui M,                                 Hillebrands B.        
                Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions. Sensors. 2019; 19(3):583.
        https://doi.org/10.3390/s19030583
    
    Chicago/Turabian Style
    
                                Conca Parra, Andrés,                                 Frederick Casper,                                 Johannes Paul,                                 Ronald Lehndorff,                                 Christian Haupt,                                 Gerhard Jakob,                                 Mathias Kläui,                                 and Burkard Hillebrands.        
                2019. "Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions" Sensors 19, no. 3: 583.
        https://doi.org/10.3390/s19030583
    
    APA Style
    
                                Conca Parra, A.,                                 Casper, F.,                                 Paul, J.,                                 Lehndorff, R.,                                 Haupt, C.,                                 Jakob, G.,                                 Kläui, M.,                                 & Hillebrands, B.        
        
        (2019). Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions. Sensors, 19(3), 583.
        https://doi.org/10.3390/s19030583