Jung, H.; Park, C.; Lee, H.; Hong, S.; Kim, H.; Cho, S.J.
Nano-Cracked Strain Sensor with High Sensitivity and Linearity by Controlling the Crack Arrangement. Sensors 2019, 19, 2834.
https://doi.org/10.3390/s19122834
AMA Style
Jung H, Park C, Lee H, Hong S, Kim H, Cho SJ.
Nano-Cracked Strain Sensor with High Sensitivity and Linearity by Controlling the Crack Arrangement. Sensors. 2019; 19(12):2834.
https://doi.org/10.3390/s19122834
Chicago/Turabian Style
Jung, Hyunsuk, Chan Park, Hyunwoo Lee, Seonguk Hong, Hyonguk Kim, and Seong J. Cho.
2019. "Nano-Cracked Strain Sensor with High Sensitivity and Linearity by Controlling the Crack Arrangement" Sensors 19, no. 12: 2834.
https://doi.org/10.3390/s19122834
APA Style
Jung, H., Park, C., Lee, H., Hong, S., Kim, H., & Cho, S. J.
(2019). Nano-Cracked Strain Sensor with High Sensitivity and Linearity by Controlling the Crack Arrangement. Sensors, 19(12), 2834.
https://doi.org/10.3390/s19122834