Jung, H.;                     Park, C.;                     Lee, H.;                     Hong, S.;                     Kim, H.;                     Cho, S.J.    
        Nano-Cracked Strain Sensor with High Sensitivity and Linearity by Controlling the Crack Arrangement. Sensors 2019, 19, 2834.
    https://doi.org/10.3390/s19122834
    AMA Style
    
                                Jung H,                                 Park C,                                 Lee H,                                 Hong S,                                 Kim H,                                 Cho SJ.        
                Nano-Cracked Strain Sensor with High Sensitivity and Linearity by Controlling the Crack Arrangement. Sensors. 2019; 19(12):2834.
        https://doi.org/10.3390/s19122834
    
    Chicago/Turabian Style
    
                                Jung, Hyunsuk,                                 Chan Park,                                 Hyunwoo Lee,                                 Seonguk Hong,                                 Hyonguk Kim,                                 and Seong J. Cho.        
                2019. "Nano-Cracked Strain Sensor with High Sensitivity and Linearity by Controlling the Crack Arrangement" Sensors 19, no. 12: 2834.
        https://doi.org/10.3390/s19122834
    
    APA Style
    
                                Jung, H.,                                 Park, C.,                                 Lee, H.,                                 Hong, S.,                                 Kim, H.,                                 & Cho, S. J.        
        
        (2019). Nano-Cracked Strain Sensor with High Sensitivity and Linearity by Controlling the Crack Arrangement. Sensors, 19(12), 2834.
        https://doi.org/10.3390/s19122834