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Sensors 2018, 18(11), 3841;

Tip-Enhanced Raman Spectroscopy with High-Order Fiber Vector Beam Excitation

MOE Key Laboratory of Material Physics and Chemistry under Extraordinary Conditions and Shaanxi Key Laboratory of Optical Information Technology, School of Science, Northwestern Polytechnical University, Xi’an 710072, China
State Key Laboratory of Physical Chemistry of Solid surface, Department of Chemistry, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
Authors to whom correspondence should be addressed.
Received: 19 October 2018 / Revised: 5 November 2018 / Accepted: 7 November 2018 / Published: 9 November 2018
(This article belongs to the Special Issue Applications of Raman Spectroscopy in Sensors)
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We investigated tip-enhanced Raman spectra excited by high-order fiber vector beams. Theoretical analysis shows that the high-order fiber vector beams have stronger longitudinal electric field components than linearly polarized light under tight focusing conditions. By introducing the high-order fiber vector beams and the linearly polarized beam from a fiber vector beam generator based on an electrically-controlled acoustically-induced fiber grating into a top-illumination tip-enhanced Raman spectroscopy (TERS) setup, the tip-enhanced Raman signal produced by the high-order fiber vector beams was 1.6 times as strong as that produced by the linearly polarized light. This result suggests a new type of efficient excitation light beams for TERS. View Full-Text
Keywords: tip-enhanced Raman spectroscopy; field enhancement; fiber vector beam tip-enhanced Raman spectroscopy; field enhancement; fiber vector beam

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Lu, F.; Huang, T.; Han, L.; Su, H.; Wang, H.; Liu, M.; Zhang, W.; Wang, X.; Mei, T. Tip-Enhanced Raman Spectroscopy with High-Order Fiber Vector Beam Excitation. Sensors 2018, 18, 3841.

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