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Journal: Sensors, 2018
Volume: 18
Number: 3340

Article: Sensing and Reliability Improvement of Electrostatic-Discharge Transient by Discrete Engineering for High-Voltage 60-V n-Channel Lateral-Diffused MOSFETs with Embedded Silicon-Controlled Rectifiers
Authors: by Shen-Li Chen and Yi-Cih Wu
Link: https://www.mdpi.com/1424-8220/18/10/3340

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