Kafarski, M.; Wilczek, A.; Szypłowska, A.; Lewandowski, A.; Pieczywek, P.; Janik, G.; Skierucha, W.
Evaluation of Apple Maturity with Two Types of Dielectric Probes. Sensors 2018, 18, 121.
https://doi.org/10.3390/s18010121
AMA Style
Kafarski M, Wilczek A, Szypłowska A, Lewandowski A, Pieczywek P, Janik G, Skierucha W.
Evaluation of Apple Maturity with Two Types of Dielectric Probes. Sensors. 2018; 18(1):121.
https://doi.org/10.3390/s18010121
Chicago/Turabian Style
Kafarski, Marcin, Andrzej Wilczek, Agnieszka Szypłowska, Arkadiusz Lewandowski, Piotr Pieczywek, Grzegorz Janik, and Wojciech Skierucha.
2018. "Evaluation of Apple Maturity with Two Types of Dielectric Probes" Sensors 18, no. 1: 121.
https://doi.org/10.3390/s18010121
APA Style
Kafarski, M., Wilczek, A., Szypłowska, A., Lewandowski, A., Pieczywek, P., Janik, G., & Skierucha, W.
(2018). Evaluation of Apple Maturity with Two Types of Dielectric Probes. Sensors, 18(1), 121.
https://doi.org/10.3390/s18010121