Evaluation of Apple Maturity with Two Types of Dielectric Probes
Kafarski, M.; Wilczek, A.; Szypłowska, A.; Lewandowski, A.; Pieczywek, P.; Janik, G.; Skierucha, W. Evaluation of Apple Maturity with Two Types of Dielectric Probes. Sensors 2018, 18, 121. https://doi.org/10.3390/s18010121
Kafarski M, Wilczek A, Szypłowska A, Lewandowski A, Pieczywek P, Janik G, Skierucha W. Evaluation of Apple Maturity with Two Types of Dielectric Probes. Sensors. 2018; 18(1):121. https://doi.org/10.3390/s18010121
Chicago/Turabian StyleKafarski, Marcin, Andrzej Wilczek, Agnieszka Szypłowska, Arkadiusz Lewandowski, Piotr Pieczywek, Grzegorz Janik, and Wojciech Skierucha. 2018. "Evaluation of Apple Maturity with Two Types of Dielectric Probes" Sensors 18, no. 1: 121. https://doi.org/10.3390/s18010121