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Journal: Sensors, 2016
Volume: 16
Number: 1598

Article: Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography
Authors: by Muhammad Faizan Shirazi, Kibeom Park, Ruchire Eranga Wijesinghe, Hyosang Jeong, Sangyeob Han, Pilun Kim, Mansik Jeon and Jeehyun Kim
Link: https://www.mdpi.com/1424-8220/16/10/1598

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