Shirazi, M.F.; Park, K.; Wijesinghe, R.E.; Jeong, H.; Han, S.; Kim, P.; Jeon, M.; Kim, J.
Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography. Sensors 2016, 16, 1598.
https://doi.org/10.3390/s16101598
AMA Style
Shirazi MF, Park K, Wijesinghe RE, Jeong H, Han S, Kim P, Jeon M, Kim J.
Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography. Sensors. 2016; 16(10):1598.
https://doi.org/10.3390/s16101598
Chicago/Turabian Style
Shirazi, Muhammad Faizan, Kibeom Park, Ruchire Eranga Wijesinghe, Hyosang Jeong, Sangyeob Han, Pilun Kim, Mansik Jeon, and Jeehyun Kim.
2016. "Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography" Sensors 16, no. 10: 1598.
https://doi.org/10.3390/s16101598
APA Style
Shirazi, M. F., Park, K., Wijesinghe, R. E., Jeong, H., Han, S., Kim, P., Jeon, M., & Kim, J.
(2016). Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography. Sensors, 16(10), 1598.
https://doi.org/10.3390/s16101598