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Open AccessArticle

A Dynamic Range Enhanced Readout Technique with a Two-Step TDC for High Speed Linear CMOS Image Sensors

School of Electronic Information Engineering, Tianjin University, 92 Weijin Road, Nankai District, Tianjin 300072, China
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Academic Editor: Vittorio M. N. Passaro
Sensors 2015, 15(11), 28224-28243; https://doi.org/10.3390/s151128224
Received: 31 August 2015 / Revised: 22 October 2015 / Accepted: 2 November 2015 / Published: 6 November 2015
(This article belongs to the Section Physical Sensors)
This paper presents a dynamic range (DR) enhanced readout technique with a two-step time-to-digital converter (TDC) for high speed linear CMOS image sensors. A multi-capacitor and self-regulated capacitive trans-impedance amplifier (CTIA) structure is employed to extend the dynamic range. The gain of the CTIA is auto adjusted by switching different capacitors to the integration node asynchronously according to the output voltage. A column-parallel ADC based on a two-step TDC is utilized to improve the conversion rate. The conversion is divided into coarse phase and fine phase. An error calibration scheme is also proposed to correct quantization errors caused by propagation delay skew within −Tclk~+Tclk. A linear CMOS image sensor pixel array is designed in the 0.13 μm CMOS process to verify this DR-enhanced high speed readout technique. The post simulation results indicate that the dynamic range of readout circuit is 99.02 dB and the ADC achieves 60.22 dB SNDR and 9.71 bit ENOB at a conversion rate of 2 MS/s after calibration, with 14.04 dB and 2.4 bit improvement, compared with SNDR and ENOB of that without calibration. View Full-Text
Keywords: CMOS image sensor; CTIA; wide dynamic range; two-step TDC; error calibration CMOS image sensor; CTIA; wide dynamic range; two-step TDC; error calibration
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MDPI and ACS Style

Gao, Z.; Yang, C.; Xu, J.; Nie, K. A Dynamic Range Enhanced Readout Technique with a Two-Step TDC for High Speed Linear CMOS Image Sensors. Sensors 2015, 15, 28224-28243. https://doi.org/10.3390/s151128224

AMA Style

Gao Z, Yang C, Xu J, Nie K. A Dynamic Range Enhanced Readout Technique with a Two-Step TDC for High Speed Linear CMOS Image Sensors. Sensors. 2015; 15(11):28224-28243. https://doi.org/10.3390/s151128224

Chicago/Turabian Style

Gao, Zhiyuan; Yang, Congjie; Xu, Jiangtao; Nie, Kaiming. 2015. "A Dynamic Range Enhanced Readout Technique with a Two-Step TDC for High Speed Linear CMOS Image Sensors" Sensors 15, no. 11: 28224-28243. https://doi.org/10.3390/s151128224

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