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A Wide Spectral Range Reflectance and Luminescence Imaging System

Institute of Photonics, University of Eastern Finland, P.O.Box 111, FI–80101 Joensuu, Finland
Palomäentie 4, FI–88620 Korholanmäki, Finland
Author to whom correspondence should be addressed.
Sensors 2013, 13(11), 14500-14510;
Received: 21 August 2013 / Revised: 17 October 2013 / Accepted: 18 October 2013 / Published: 25 October 2013
(This article belongs to the Special Issue Spectral Imaging at the Microscale and Beyond)
In this study, we introduce a wide spectral range (200–2500 nm) imaging system with a 250 μm minimum spatial resolution, which can be freely modified for a wide range of resolutions and measurement geometries. The system has been tested for reflectance and luminescence measurements, but can also be customized for transmittance measurements. This study includes the performance results of the developed system, as well as examples of spectral images. Discussion of the system relates it to existing systems and methods. The wide range spectral imaging system that has been developed is however highly customizable and has great potential in many practical applications. View Full-Text
Keywords: hyperspectral sensors; hyperspectral imaging; luminescence hyperspectral sensors; hyperspectral imaging; luminescence
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MDPI and ACS Style

Hirvonen, T.; Penttinen, N.; Hauta–Kasari, M.; Sorjonen, M.; Peiponen, K. A Wide Spectral Range Reflectance and Luminescence Imaging System. Sensors 2013, 13, 14500-14510.

AMA Style

Hirvonen T, Penttinen N, Hauta–Kasari M, Sorjonen M, Peiponen K. A Wide Spectral Range Reflectance and Luminescence Imaging System. Sensors. 2013; 13(11):14500-14510.

Chicago/Turabian Style

Hirvonen, Tapani, Niko Penttinen, Markku Hauta–Kasari, Mika Sorjonen, and Kai–Erik Peiponen. 2013. "A Wide Spectral Range Reflectance and Luminescence Imaging System" Sensors 13, no. 11: 14500-14510.

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