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Sensors 2011, 11(5), 5215-5228;

Modeling of Beams’ Multiple-Contact Mode with an Application in the Design of a High-g Threshold Microaccelerometer

Key Laboratory for Thin Film and Microfabrication of Ministry of Education, National Key Laboratory of Nano/Micro Fabrication Technology, Research Institute of Micro/Nanometer Science and Technology, Shanghai Jiao Tong University, Shanghai, 200240, China
Authors to whom correspondence should be addressed.
Received: 25 January 2011 / Revised: 30 March 2011 / Accepted: 26 April 2011 / Published: 11 May 2011
(This article belongs to the Section Physical Sensors)
Full-Text   |   PDF [348 KB, uploaded 21 June 2014]


Beam’s multiple-contact mode, characterized by multiple and discrete contact regions, non-uniform stoppers’ heights, irregular contact sequence, seesaw-like effect, indirect interaction between different stoppers, and complex coupling relationship between loads and deformation is studied. A novel analysis method and a novel high speed calculation model are developed for multiple-contact mode under mechanical load and electrostatic load, without limitations on stopper height and distribution, providing the beam has stepped or curved shape. Accurate values of deflection, contact load, contact region and so on are obtained directly, with a subsequent validation by CoventorWare. A new concept design of high-g threshold microaccelerometer based on multiple-contact mode is presented, featuring multiple acceleration thresholds of one sensitive component and consequently small sensor size. View Full-Text
Keywords: multiple-contact mode; beam; high-g; threshold microaccelerometer multiple-contact mode; beam; high-g; threshold microaccelerometer
This is an open access article distributed under the Creative Commons Attribution License (CC BY 3.0).

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MDPI and ACS Style

Li, K.; Chen, W.; Zhang, W. Modeling of Beams’ Multiple-Contact Mode with an Application in the Design of a High-g Threshold Microaccelerometer. Sensors 2011, 11, 5215-5228.

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