Genetic Mapping and Characterization of Verticillium Wilt Resistance in a Recombinant Inbred Population of Upland Cotton
Abstract
Share and Cite
Wilson, I.W.; Moncuquet, P.; Yuan, Y.; Soliveres, M.; Li, Z.; Stiller, W.; Zhu, Q.-H. Genetic Mapping and Characterization of Verticillium Wilt Resistance in a Recombinant Inbred Population of Upland Cotton. Int. J. Mol. Sci. 2024, 25, 2439. https://doi.org/10.3390/ijms25042439
Wilson IW, Moncuquet P, Yuan Y, Soliveres M, Li Z, Stiller W, Zhu Q-H. Genetic Mapping and Characterization of Verticillium Wilt Resistance in a Recombinant Inbred Population of Upland Cotton. International Journal of Molecular Sciences. 2024; 25(4):2439. https://doi.org/10.3390/ijms25042439
Chicago/Turabian StyleWilson, Iain W., Philippe Moncuquet, Yuman Yuan, Melanie Soliveres, Zitong Li, Warwick Stiller, and Qian-Hao Zhu. 2024. "Genetic Mapping and Characterization of Verticillium Wilt Resistance in a Recombinant Inbred Population of Upland Cotton" International Journal of Molecular Sciences 25, no. 4: 2439. https://doi.org/10.3390/ijms25042439
APA StyleWilson, I. W., Moncuquet, P., Yuan, Y., Soliveres, M., Li, Z., Stiller, W., & Zhu, Q.-H. (2024). Genetic Mapping and Characterization of Verticillium Wilt Resistance in a Recombinant Inbred Population of Upland Cotton. International Journal of Molecular Sciences, 25(4), 2439. https://doi.org/10.3390/ijms25042439

