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Journal: Int. J. Mol. Sci., 2021
Volume: 22
Number: 8455
8455
Article: Effect of Extreme Ultraviolet (EUV) Radiation and EUV Induced, N₂ and O₂ Based Plasmas on a PEEK Surface’s Physico-Chemical Properties and MG63 Cell Adhesion
Authors: by Joanna Czwartos, Bogusław Budner, Andrzej Bartnik, Przemysław Wachulak, Beata A. Butruk-Raszeja, Adam Lech, Tomasz Ciach and Henryk Fiedorowicz
Link: https://www.mdpi.com/1422-0067/22/16/8455

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