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Article

Genome-Wide Association Study Reveals Novel Genomic Regions for Grain Yield and Yield-Related Traits in Drought-Stressed Synthetic Hexaploid Wheat

1
Department of Agronomy and Horticulture, University of Nebraska-Lincoln, Lincoln, NE 68583, USA
2
International Maize and Wheat Improvement Center (CIMMYT), 06511 Emek, Ankara, Turkey
*
Author to whom correspondence should be addressed.
Int. J. Mol. Sci. 2018, 19(10), 3011; https://doi.org/10.3390/ijms19103011
Received: 20 August 2018 / Revised: 27 September 2018 / Accepted: 29 September 2018 / Published: 2 October 2018
(This article belongs to the Special Issue Plant Genetics and Molecular Breeding)
Synthetic hexaploid wheat (SHW; 2n = 6x = 42, AABBDD, Triticum aestivum L.) is produced from an interspecific cross between durum wheat (2n = 4x = 28, AABB, T. turgidum L.) and goat grass (2n = 2x = 14, DD, Aegilops tauschii Coss.) and is reported to have significant novel alleles-controlling biotic and abiotic stresses resistance. A genome-wide association study (GWAS) was conducted to unravel these loci [marker–trait associations (MTAs)] using 35,648 genotyping-by-sequencing-derived single nucleotide polymorphisms in 123 SHWs. We identified 90 novel MTAs (45, 11, and 34 on the A, B, and D genomes, respectively) and haplotype blocks associated with grain yield and yield-related traits including root traits under drought stress. The phenotypic variance explained by the MTAs ranged from 1.1% to 32.3%. Most of the MTAs (120 out of 194) identified were found in genes, and of these 45 MTAs were in genes annotated as having a potential role in drought stress. This result provides further evidence for the reliability of MTAs identified. The large number of MTAs (53) identified especially on the D-genome demonstrate the potential of SHWs for elucidating the genetic architecture of complex traits and provide an opportunity for further improvement of wheat under rapidly changing climatic conditions. View Full-Text
Keywords: marker–trait association; haplotype block; genes; root traits; D-genome; genotyping-by-sequencing; single nucleotide polymorphism; durum wheat; bread wheat; complex traits marker–trait association; haplotype block; genes; root traits; D-genome; genotyping-by-sequencing; single nucleotide polymorphism; durum wheat; bread wheat; complex traits
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MDPI and ACS Style

Bhatta, M.; Morgounov, A.; Belamkar, V.; Baenziger, P.S. Genome-Wide Association Study Reveals Novel Genomic Regions for Grain Yield and Yield-Related Traits in Drought-Stressed Synthetic Hexaploid Wheat. Int. J. Mol. Sci. 2018, 19, 3011. https://doi.org/10.3390/ijms19103011

AMA Style

Bhatta M, Morgounov A, Belamkar V, Baenziger PS. Genome-Wide Association Study Reveals Novel Genomic Regions for Grain Yield and Yield-Related Traits in Drought-Stressed Synthetic Hexaploid Wheat. International Journal of Molecular Sciences. 2018; 19(10):3011. https://doi.org/10.3390/ijms19103011

Chicago/Turabian Style

Bhatta, Madhav, Alexey Morgounov, Vikas Belamkar, and P. S. Baenziger 2018. "Genome-Wide Association Study Reveals Novel Genomic Regions for Grain Yield and Yield-Related Traits in Drought-Stressed Synthetic Hexaploid Wheat" International Journal of Molecular Sciences 19, no. 10: 3011. https://doi.org/10.3390/ijms19103011

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