Genome-Wide Association Study Reveals Novel Genomic Regions for Grain Yield and Yield-Related Traits in Drought-Stressed Synthetic Hexaploid Wheat
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Bhatta, M.; Morgounov, A.; Belamkar, V.; Baenziger, P.S. Genome-Wide Association Study Reveals Novel Genomic Regions for Grain Yield and Yield-Related Traits in Drought-Stressed Synthetic Hexaploid Wheat. Int. J. Mol. Sci. 2018, 19, 3011. https://doi.org/10.3390/ijms19103011
Bhatta M, Morgounov A, Belamkar V, Baenziger PS. Genome-Wide Association Study Reveals Novel Genomic Regions for Grain Yield and Yield-Related Traits in Drought-Stressed Synthetic Hexaploid Wheat. International Journal of Molecular Sciences. 2018; 19(10):3011. https://doi.org/10.3390/ijms19103011
Chicago/Turabian StyleBhatta, Madhav; Morgounov, Alexey; Belamkar, Vikas; Baenziger, P. S. 2018. "Genome-Wide Association Study Reveals Novel Genomic Regions for Grain Yield and Yield-Related Traits in Drought-Stressed Synthetic Hexaploid Wheat" Int. J. Mol. Sci. 19, no. 10: 3011. https://doi.org/10.3390/ijms19103011