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Journal: Entropy, 2026
Volume: 28
Number: 174

Article: MFE-YOLO: A Multi-Scale Feature Enhanced Network for PCB Defect Detection with Cross-Group Attention and FIoU Loss
Authors: by Ruohai Di, Hao Fan, Hanxiao Feng, Zhigang Lv, Lei Shu, Rui Xie and Ruoyu Qian
Link: https://www.mdpi.com/1099-4300/28/2/174

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