Order Article Reprints
Journal: Entropy, 2026
Volume: 28
Number: 174
Article:
MFE-YOLO: A Multi-Scale Feature Enhanced Network for PCB Defect Detection with Cross-Group Attention and FIoU Loss
Authors:
by
Ruohai Di, Hao Fan, Hanxiao Feng, Zhigang Lv, Lei Shu, Rui Xie and Ruoyu Qian
Link:
https://www.mdpi.com/1099-4300/28/2/174
MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover
and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article
and designed to be complimentary to the journal.