Special Issue "Microelectronics Design and Precision Instrumentation"

A special issue of Instruments (ISSN 2410-390X).

Deadline for manuscript submissions: closed (31 May 2020) | Viewed by 289

Special Issue Editor

1. Dept. Física Quàntica i Astrofísica. Institut de Ciències del Cosmos (ICCUB), Universitat de Barcelona, 08028 Barcelona, Spain
2. Institut d'Estudis Espacials de Catalunya (IEEC), C/ Gran Capità, 2-4, 08034 Barcelona, Spain
Interests: detectors and scientific instrumentation; microelectronics design; mixed-signal ASICs; low-noise electronics; front-end electronics; fast photo-sensor readout; single-photon sensors; radiation and particle detectors; medical imaging
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Special Issue Information

Dear colleagues,

The application of microelectronics in scientific and industrial instrumentation is ubiquitous and continuously evolving. Science and technology alike depend on the ability to measure a huge variety of phenomena and process the information associated to such measurements. All kinds of modern instruments make extensive use of microelectronics to perform such functions, which are, among others: sensors, analog front-end electronics, signal conversion, digital processing, and communication circuits.

The aim of this Special Issue is to collect contributions to review the application of microelectronics in different domains of the instrumentation. Particularly, we focus on the application of microelectronics in precision instrumentation. This includes scientific instruments (from astrophysics and space missions to particle physics experiments) and related fields such as molecular and biomedical imaging and industrial applications of multispectral imagers and radiation detector systems. Those instruments are designed to detect from microwaves (meV) to very-high-energy particles (>100 TeV). These are demanding applications that impose stringent requirements on the readout systems in terms of noise, speed, density, and environmental operating conditions (e.g., radiation, vacuum, temperature, etc.).

The goal is to create a well-balanced collection of papers that will help to map the application of microelectronics design in instruments in various application areas and also identify the perspectives and open challenges for future development. This ample review intends to simulate cross-fertilization and to help to identify synergies between different techniques.

We invite the submission of contributions addressing, but not limited to, the following applications of microelectronics in instrumentation:

  1. Scientific instrumentation
    • Particle and nuclear detectors (e.g., pixels, trackers, calorimeters, and others)
    • Astrophysics and astro-particle physics
    • Scientific imagers (e.g., CMOS, CCD)
    • Microwave and cryogenic detectors
    • Space instrumentation
  2. Industrial applications
    • Molecular and medical imaging
    • Imaging in biology
    • Security and inspection
    • Transportation and autonomous driving
    • Others: mining, geology, agriculture, etc.

Prof. David Gascon
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Instruments is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Published Papers

There is no accepted submissions to this special issue at this moment.
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