Applied Metrology and Instrumentation for Emerging Technologies
A special issue of Instruments (ISSN 2410-390X).
Deadline for manuscript submissions: 28 February 2026 | Viewed by 20
Special Issue Editors
Interests: mechanical and thermal measurements; non-contact measurement techniques; acoustics; vibro-acoustics; ultrasonics; measurements in biomedical engineering
Interests: measurements in biomedical engineering, medical devices; artificial intelligence and machine learning in healthcare; biomedical signal processing; personalized medicine
Interests: optical (bio)sensors; optofluidic; opto-electronics; optical instrumentation and measurements; artificial intelligence for optical sensing
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The ongoing digital transformation is influencing both the development of emerging technologies and the methodologies adopted for their measurement, validation, and integration. Advanced systems such as eXtended reality (XR), artificial intelligence (AI), brain–computer interfaces (BCIs), robotics, and intelligent sensor networks are increasingly embedded in a wide range of applications across healthcare, industry, education, and beyond. In this evolving landscape, metrology—the science of measurement—plays a fundamental role in ensuring the accuracy, reliability, traceability, and transparency required for the responsible deployment of such technologies.
This Special Issue focuses on the intersection between instrumentation science and applied metrology, with particular emphasis on the design, implementation, and characterization of innovative instruments and measurement systems supporting these emerging domains. Of particular interest are contributions addressing novel experimental methods, advanced data acquisition and signal processing architectures, performance evaluation, uncertainty quantification, and metrological traceability.
The Special Issue welcomes submissions that contribute to the development of measurement frameworks for XR systems, AI-enabled devices, neuroengineering applications, robotic platforms, and cyber-physical systems. Furthermore, studies that address sustainability metrics, environmental and human impact assessment, data ethics, and regulatory compliance—including alignment with the EU AI Act, Data Act, and GDPR—are highly encouraged. Interdisciplinary contributions demonstrating rigorous experimental methodologies and strong metrological foundations are particularly valued.
Topic of Interest:
- Metrological methods in emerging technology.
- Measurement and validation frameworks for AI-based technologies.
- Signal acquisition and processing in brain–computer interface systems.
- Metrological characterization of XR, AR, and VR systems.
- Smart sensors, transducers, and embedded measurement platforms.
- Human-centered metrics: usability, cognitive load, and physiological impact.
- Sustainability-oriented instrumentation and environmental impact assessment.
- Data acquisition systems and real-time processing architectures.
- Sensors and measuring systems empowered by the use of ML and DL.
- Uncertainty assessment and uncertainty source analysis.
- Interoperability, standardization, and benchmarking of complex instrumentation.
Dr. Milena Martarelli
Dr. Sabatina Criscuolo
Dr. Valentina Bello
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Instruments is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- applied metrology
- measurement instrumentation
- extended reality
- artificial intelligence
- neuroengineering
- signal acquisition
- signal processing
- human–machine interaction
- sustainability
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