Order Article Reprints

Winkler B, Nagel C, Farchmin N, Heidenreich S, Loewe A, Dössel O, Bär M. Global Sensitivity Analysis and Uncertainty Quantification for Simulated Atrial Electrocardiograms. Metrology. 2023; 3(1):1-28. https://doi.org/10.3390/metrology3010001

Winkler, Benjamin, Claudia Nagel, Nando Farchmin, Sebastian Heidenreich, Axel Loewe, Olaf Dössel, and Markus Bär. 2023. "Global Sensitivity Analysis and Uncertainty Quantification for Simulated Atrial Electrocardiograms" Metrology 3, no. 1: 1-28. https://doi.org/10.3390/metrology3010001

Winkler, B., Nagel, C., Farchmin, N., Heidenreich, S., Loewe, A., Dössel, O., & Bär, M. (2023). Global Sensitivity Analysis and Uncertainty Quantification for Simulated Atrial Electrocardiograms. Metrology, 3(1), 1-28. https://doi.org/10.3390/metrology3010001