Baroni, T.; Benedetto, F.D.; Giaccherini, A.; Berretti, E.; Russo, F.; Guerri, A.; Innocenti, M.; Carlà , F.; Felici, R.
Surface X-ray Diffraction Study of a Bi-Layer Junction Based on Cu and Cd Sulfides for Photovoltaic Applications. Mater. Proc. 2020, 2, 27.
https://doi.org/10.3390/CIWC2020-06836
AMA Style
Baroni T, Benedetto FD, Giaccherini A, Berretti E, Russo F, Guerri A, Innocenti M, Carlà F, Felici R.
Surface X-ray Diffraction Study of a Bi-Layer Junction Based on Cu and Cd Sulfides for Photovoltaic Applications. Materials Proceedings. 2020; 2(1):27.
https://doi.org/10.3390/CIWC2020-06836
Chicago/Turabian Style
Baroni, Tommaso, Francesco Di Benedetto, Andrea Giaccherini, Enrico Berretti, Francesca Russo, Annalisa Guerri, Massimo Innocenti, Francesco Carlà , and Roberto Felici.
2020. "Surface X-ray Diffraction Study of a Bi-Layer Junction Based on Cu and Cd Sulfides for Photovoltaic Applications" Materials Proceedings 2, no. 1: 27.
https://doi.org/10.3390/CIWC2020-06836
APA Style
Baroni, T., Benedetto, F. D., Giaccherini, A., Berretti, E., Russo, F., Guerri, A., Innocenti, M., Carlà , F., & Felici, R.
(2020). Surface X-ray Diffraction Study of a Bi-Layer Junction Based on Cu and Cd Sulfides for Photovoltaic Applications. Materials Proceedings, 2(1), 27.
https://doi.org/10.3390/CIWC2020-06836
