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Journal: Optics, 2025
Volume: 6
Number: 55
55
Article: Multi-Channel Wide-Spectrum High-Resolution Spectrometer for Thin-Film Thickness Measurement
Authors: by Tong Wu, Haopeng Li, Chuan Zhang, Jingwei Yu, Jianjun Liu, Zepei Zheng, Bosong Duan, Anyu Sun and Bingfeng Ju
Link: https://www.mdpi.com/2673-3269/6/4/55

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