Spatially Resolved XPS Characterization of Electrochemical Surfaces
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Dipartimento di Ingegneria dell’Innovazione, Università del Salento, v. Monteroni, 73100 Lecce, Italy
2
Jožef Stefan Institute, Jamova cesta 39, 1000 Ljubljana, Slovenia
3
Elettra - Sinctrotrone Trieste S.C.p.A. S.S. 14, km 163.5 in Area Science Park, 34149 Trieste-Basovizza, Italy
4
Institute of Physical Chemistry, Bulgarian Academy of Sciences, 1113 Sofia, Bulgaria
*
Author to whom correspondence should be addressed.
Surfaces 2019, 2(2), 295-314; https://doi.org/10.3390/surfaces2020022
Received: 20 February 2019
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Revised: 5 April 2019
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Accepted: 9 April 2019
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Published: 15 April 2019
(This article belongs to the Special Issue Electrochemical Surface Science: Basics and Applications)
Synchrotron-based scanning photoelectron microscopy (SPEM) has opened unique opportunities for exploiting processes occurring at surfaces and interfaces, which control the properties of materials for electrochemical devices, where issues of chemical and morphological complexity at microscopic length scales should be faced and understood. The present article aims to demonstrate the present capabilities of SPEM to explore the surface composition of micro- and nano-structured materials, focusing on cases relevant to electrochemical technologies. We report and discuss a selection of recent results about three different systems, targeting hot topics in the fields of electrochemical energy storage and electrochemical fabrication: (i) an in-depth analysis of Ag-In electrodeposited alloys exhibiting dynamic pattern formation, (ii) the analysis of electrochemical processes at the electrodes of a self-driven solid oxide fuel cell and (iii) an operando characterization of a single-chamber solid oxide fuel cell. The last example has been performed at near-ambient pressure conditions using a unique specially designed setup which extends the traditional capabilities of scanning photoemission microscopes in the ultra-high and high-vacuum regimes to operating conditions that are closer to realistic ones, contributing to overcome the so-called “pressure gap”.
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Keywords:
operando; near ambient pressure XPS; scanning photoelectron microscopy; solid oxide fuel cells; surface science; electrodeposited alloys
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
MDPI and ACS Style
Bozzini, B.; Kuscer, D.; Amati, M.; Gregoratti, L.; Zeller, P.; Dobrovolska, T.; Krastev, I. Spatially Resolved XPS Characterization of Electrochemical Surfaces. Surfaces 2019, 2, 295-314. https://doi.org/10.3390/surfaces2020022
AMA Style
Bozzini B, Kuscer D, Amati M, Gregoratti L, Zeller P, Dobrovolska T, Krastev I. Spatially Resolved XPS Characterization of Electrochemical Surfaces. Surfaces. 2019; 2(2):295-314. https://doi.org/10.3390/surfaces2020022
Chicago/Turabian StyleBozzini, Benedetto, Danjela Kuscer, Matteo Amati, Luca Gregoratti, Patrick Zeller, Tsvetina Dobrovolska, and Ivan Krastev. 2019. "Spatially Resolved XPS Characterization of Electrochemical Surfaces" Surfaces 2, no. 2: 295-314. https://doi.org/10.3390/surfaces2020022
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