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Jafarul Tarek AH, Mozaffor Onik TA, Lai CW, Abdul Razak B, Kee CC, Wong YH. Properties of Bilayer Zr- and Sm-Oxide Gate Dielectric on 4H-SiC Substrate Under Varying Nitrogen and Oxygen Concentrations. Ceramics. 2025; 8(2):49. https://doi.org/10.3390/ceramics8020049

Jafarul Tarek, Ahmad Hafiz, Tahsin Ahmed Mozaffor Onik, Chin Wei Lai, Bushroa Abdul Razak, Chia Ching Kee, and Yew Hoong Wong. 2025. "Properties of Bilayer Zr- and Sm-Oxide Gate Dielectric on 4H-SiC Substrate Under Varying Nitrogen and Oxygen Concentrations" Ceramics 8, no. 2: 49. https://doi.org/10.3390/ceramics8020049

Jafarul Tarek, A. H., Mozaffor Onik, T. A., Lai, C. W., Abdul Razak, B., Kee, C. C., & Wong, Y. H. (2025). Properties of Bilayer Zr- and Sm-Oxide Gate Dielectric on 4H-SiC Substrate Under Varying Nitrogen and Oxygen Concentrations. Ceramics, 8(2), 49. https://doi.org/10.3390/ceramics8020049