Experimental Investigation of Surface Integrity Analysis Using Machine Learning for Nano-Powder Mixed Electrical Discharge Machining
Abstract
1. Introduction
2. Materials and Methods
2.1. Measurement of Output Responses
2.2. Machine Learning (ML) Techniques
- Training Data (80%): 25 samples used to train machine learning algorithms. The training dataset can be found in Table A1 of Appendix A.
- Testing Data (20%): 7 samples used for model validation and performance evaluation. The testing dataset can be found in Table A2 of Appendix A.
3. Results and Discussion
3.1. Impact of the Machining Parameters on Surface Roughness
3.2. Impact of the Machining Parameters on SCD
3.3. Impact of the Machining Parameters on Residual Stress
3.4. Predication of Surface Roughness Using Machine Learning Techniques
4. Conclusions
- Optimal Process Parameters: Within the investigated experimental domain, optimal surface integrity was achieved at gap current of 9 A, pulse-on time of 100 µs, pulse-off time of 10 µs, and gap voltage of 65 V with the TiO2-enhanced Jatropha dielectric. This parametric configuration simultaneously minimized surface roughness (3.22 µm), achieved zero surface crack density, and produced minimal residual stress across the measured 2θ range of 90° to 180°.
- Surface Roughness Enhancement Mechanism: The incorporation of TiO2 nanoparticles in the dielectric medium significantly improved surface finish quality, reducing surface roughness from 4.5 µm (without nanoparticles) to 3.22 µm—a 28.4% improvement. Parametric analysis revealed that pulse-on time (Ton) emerged as the most dominant parameter influencing both surface roughness and surface crack density responses, consistent with its direct control over discharge energy and thermal loading intensity.
- Machine Learning Predictive Framework: Supervised machine learning algorithms, specifically classification-based approaches (k-Nearest Neighbors, Support Vector Machine, and Gaussian Naïve Bayes), demonstrated robust predictive capabilities for surface roughness categorization. These algorithms achieved F1-scores of 0.88 and classification accuracies of 90%, validated through 10-fold stratified cross-validation. The ML framework provides an efficient computational tool for EDM process simulation and optimization, substantially reducing the experimental effort and cost associated with traditional trial-and-error parameter exploration while maintaining prediction reliability within the validated experimental domain.
- Crack-Free Surface Generation: Complete elimination of surface cracks (SCD = 0) was achieved at the optimal parameter combination (9 A current, 100 µs pulse-on, 10 µs pulse-off, and 65 V gap voltage). Parametric analysis confirmed that surface crack density exhibits direct proportionality to pulse-on duration (Ton), attributable to reduced thermal shock and lower peak temperatures at shorter pulse durations. Gap current (Ip) demonstrated a non-monotonic influence on SCD, initially increasing crack formation before declining at higher current levels, suggesting complex interactions between discharge energy and material removal mechanisms.
- Residual Stress Characterization: X-ray diffraction (XRD) analysis across the 2θ angular range of 90° to 180° revealed minimal residual stress magnitudes at the optimal parametric setting (9 A, 100 µs, 10 µs, and 65 V). Statistical analysis indicated that machining parameters exerted negligible influence on both maximum tensile and compressive residual stress components within the investigated parameter space, suggesting that the TiO2-enhanced dielectric effectively mitigates thermal gradients responsible for stress accumulation in conventional EDM processes.
Author Contributions
Funding
Data Availability Statement
Conflicts of Interest
Appendix A
| Run Orders | Input Process Parameters | Output Parameters | ||||
|---|---|---|---|---|---|---|
| Gap Current (A) | Pulse-ON Time | Pulse-OFF Time | Gap Voltage | Powder Concentration (%) | Surface Roughness (µm) | |
| (µs) | (µs) | (Volt) | ||||
| Notation | GC | PON | POFF | GV | PWC | Ra |
| 1 | 6 | 200 | 10 | 60 | 0.6 | 4.42 |
| 2 | 4.5 | 150 | 9 | 62.5 | 0.45 | 5.69 |
| 3 | 7.5 | 150 | 9 | 62.5 | 0.45 | 5.04 |
| 4 | 7.5 | 150 | 9 | 62.5 | 0.45 | 5.39 |
| 5 | 6 | 200 | 8 | 60 | 0.3 | 4.74 |
| 6 | 7.5 | 150 | 9 | 62.5 | 0.45 | 4.48 |
| 9 | 9 | 200 | 10 | 60 | 0.3 | 5.44 |
| 10 | 9 | 100 | 8 | 65 | 0.6 | 5.36 |
| 12 | 9 | 100 | 8 | 60 | 0.3 | 4.8 |
| 13 | 6 | 100 | 10 | 60 | 0.3 | 3.22 |
| 14 | 6 | 100 | 8 | 60 | 0.6 | 3.72 |
| 16 | 7.5 | 150 | 9 | 57.5 | 0.45 | 3.74 |
| 17 | 9 | 100 | 10 | 60 | 0.6 | 5.46 |
| 18 | 9 | 200 | 8 | 60 | 0.6 | 3.84 |
| 19 | 6 | 200 | 8 | 65 | 0.6 | 5.47 |
| 22 | 10.5 | 150 | 9 | 62.5 | 0.45 | 5.45 |
| 23 | 7.5 | 150 | 11 | 62.5 | 0.45 | 4.77 |
| 24 | 7.5 | 150 | 9 | 62.5 | 0.75 | 3.95 |
| 25 | 7.5 | 50 | 9 | 62.5 | 0.45 | 3.97 |
| 26 | 6 | 100 | 8 | 65 | 0.3 | 4.79 |
| 27 | 7.5 | 150 | 9 | 62.5 | 0.45 | 4.02 |
| 28 | 7.5 | 150 | 9 | 62.5 | 0.45 | 3.78 |
| 30 | 6 | 200 | 10 | 65 | 0.3 | 5.35 |
| 31 | 9 | 200 | 10 | 65 | 0.6 | 4.25 |
| 32 | 7.5 | 150 | 9 | 67.5 | 0.45 | 6.15 |
| Run Orders | Input Process Parameters | Output Parameters | ||||
|---|---|---|---|---|---|---|
| Gap Current (A) | Pulse-ON Time | Pulse-OFF Time | Gap Voltage | Powder Concentration (%) | Surface Roughness (µm) | |
| (µs) | (µs) | (Volt) | ||||
| Notation | GC | PON | POFF | GV | PWC | Ra |
| 7 | 7.5 | 150 | 9 | 62.5 | 0.45 | 3.49 |
| 8 | 7.5 | 150 | 9 | 62.5 | 0.15 | 3.76 |
| 11 | 9 | 100 | 10 | 65 | 0.3 | 3.85 |
| 15 | 7.5 | 250 | 9 | 62.5 | 0.45 | 5.1 |
| 20 | 7.5 | 150 | 7 | 62.5 | 0.45 | 5.39 |
| 21 | 9 | 200 | 8 | 65 | 0.3 | 5.58 |
| 29 | 6 | 100 | 10 | 65 | 0.6 | 4.64 |
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| Ref. | Author | Input Parameter | Response Characteristics | Findings in the Study |
|---|---|---|---|---|
| [18] | Kunal Singh (2025) | Ip, Ton and Toff | SR, MRR and TWR | Toff primarily affects SR; I and Ton have a considerable impact on MRR and TWR. |
| [19] | Ľuboslav Straka (2025) | IP, Ton, Toff and V. | SCD | Higher value of I (19 A) for longer duration. Ton (32 μs) results in an increase in SCD |
| [20] | Brajesh Kumar Lodhi (2024) | TON, TOFF, IP and WF | Material removal rate (MRR) and SR | Ton, TOFF, IP, and quadratic terms of TOFF2 and IP2 are the most influential factors of the MRR. The TON, IP and interaction term (TON × IP), and IP2 were the most significant factors for Ra. |
| [21] | Amreeta R. Kaigude (2024) | Ip, Ton, Toff and V | SR | Ip and Ton were the most significant parameters affecting SR. As the values of Ip and Ton increase, the SR also increases. |
| [22] | Guisen Wang (2023) | Ip and Ton. | SR, residual stress, WLT and SCD. | Low Ip with long Ton leads to lower SR and residual stress but more surface cracks were observed for high Ip with short Ton mode. |
| [23] | Apiwat Muttamara (2022) | Discharge current | SCD | Cracks are frequently noted in machining processes characterized by high Ton duration and low average Ip. |
| [24] | Trilochan Jamunkar (2022) | IP, Ton, Toff and V. | SR | The dimensions of the crater demonstrate a linear correlation with both the V and IP and non-linear correlation between the dimensions of the crater and the Ton. |
| [25] | Andrzej Sokołowski (2022) | Wire feed rate (WF), Ton, Toff and V. | SR | Most favorable settings for achieving high surface quality involve a minimum Ton and a maximum value of V. |
| C | SI | Cr | Mo | V | Mn |
|---|---|---|---|---|---|
| 1.55% | 0.30% | 11.8% | 0.80% | 0.80% | 0.4% |
| Properties | Density (gm/mL) | Viscosity at (27 °C) (cSt) | Thermal Conductivity (W/m K) | Specific Heat (kJ/kgK) | Breakdown Voltage (kV) | Dielectric Constant at 27 °C | Flash Point (°C) | Oxygen Content (wt %) | Carbon Content (wt %) |
|---|---|---|---|---|---|---|---|---|---|
| Jatropha Oil | 0.87 | 6.5836 | 0.147 | 1.9 | 26 | 3.238 | 170 | 1.11 | 85.32 |
| Specification | Average Particle Size (nm) | Melting Point (°C) | Bulk Density (g/cm3) | Surface Area (m2/g) |
|---|---|---|---|---|
| TiO2 nanoparticles | 30 | 1843 | 0.35 | 150 m2/g |
| Level. | −2 | −1 | 0 | 1 | 2 |
|---|---|---|---|---|---|
| Gap Current (A) | 4.5 | 6 | 7.5 | 9 | 10.5 |
| PON (µs) | 50 | 100 | 150 | 200 | 250 |
| POFF (µs) | 7 | 8 | 9 | 10 | 11 |
| Gap Voltage (Volt) | 57.5 | 60 | 62.5 | 65 | 67.5 |
| Powder Concentration (%) | 0.15 | 0.3 | 0.45 | 0.6 | 0.75 |
| Aspects | k-Nearest Neighbor (kNN) | Support Vector Classification (SVM) | Logistic Regression | Gaussian Naïve Bayes (GNB) |
|---|---|---|---|---|
| Model Type | Instance-based, non-parametric | Kernel-based, discriminative | Linear/non-linear, Probabilistic | Probabilistic, generative |
| Working Principal | Classifies based on majority vote of k nearest neighbors in feature space | Creates optimal hyperplane to separate classes using support vectors | Uses logistic function to model probability of class membership | Applies Bayes’ theorem with assumption of feature independence |
| Mathematical Foundation | Distance metrics (Euclidean, Manhattan, Minkowski) | Optimization of margin maximization with kernel functions | Maximum likelihood estimation using sigmoid function | Bayes’ theorem with Gaussian distribution assumption |
| Advantages | • Captures local surface patterns • No assumptions about data distribution • Effective for irregular surface textures • Handles complex feature interactions | • Excellent generalization capability • Effective with high-dimensional machining parameters • Robust to outliers in surface measurements • Handles non-linear relationships well | • Fast prediction for real-time applications • Provides confidence intervals • Good baseline performance • Interpretable feature importance | • Fast training and prediction • Works well with limited surface roughness data • Probabilistic uncertainty quantification • Robust to irrelevant features |
| Limitations | • Computationally expensive for large datasets • Sensitive to feature scaling • Poor performance with high-dimensional data • Memory intensive | • Requires careful hyperparameter tuning • Sensitive to feature scaling • Complex model interpretation • Longer training time | • Assumes linear relationship (without feature engineering) • May struggle with complex surface interactions • Sensitive to outliers in machining data • Limited non-linear modeling capability | • Strong independence assumption rarely holds • Poor performance with correlated machining parameters • Limited handling of feature interactions |
| Std Order | Run Orders | Pt Type | Blocks | Input Process Parameters | Output Parameter | ||||
|---|---|---|---|---|---|---|---|---|---|
| Gap Current (A) | Pulse-ON Time | Pulse-OFF Time | Gap Voltage | Powder Concentration (%) | Surface Roughness (µm) | ||||
| (µs) | (µs) | (Volt) | |||||||
| 7 | 1 | 1 | 1 | 6 | 200 | 10 | 60 | 0.6 | 5.58 |
| 17 | 2 | −1 | 1 | 4.5 | 150 | 9 | 62.5 | 0.45 | 3.78 |
| 27 | 3 | 0 | 1 | 7.5 | 150 | 9 | 62.5 | 0.45 | 3.74 |
| 32 | 4 | 0 | 1 | 7.5 | 150 | 9 | 62.5 | 0.45 | 4.79 |
| 3 | 5 | 1 | 1 | 6 | 200 | 8 | 60 | 0.3 | 3.95 |
| 28 | 6 | 0 | 1 | 7.5 | 150 | 9 | 62.5 | 0.45 | 4.42 |
| 31 | 7 | 0 | 1 | 7.5 | 150 | 9 | 62.5 | 0.45 | 5.36 |
| 25 | 8 | −1 | 1 | 7.5 | 150 | 9 | 62.5 | 0.15 | 5.44 |
| 8 | 9 | 1 | 1 | 9 | 200 | 10 | 60 | 0.3 | 5.35 |
| 10 | 10 | 1 | 1 | 9 | 100 | 8 | 65 | 0.6 | 3.84 |
| 14 | 11 | 1 | 1 | 9 | 100 | 10 | 65 | 0.3 | 3.22 |
| 2 | 12 | 1 | 1 | 9 | 100 | 8 | 60 | 0.3 | 4.25 |
| 5 | 13 | 1 | 1 | 6 | 100 | 10 | 60 | 0.3 | 4.48 |
| 1 | 14 | 1 | 1 | 6 | 100 | 8 | 60 | 0.6 | 4.64 |
| 20 | 15 | −1 | 1 | 7.5 | 250 | 9 | 62.5 | 0.45 | 6.15 |
| 23 | 16 | −1 | 1 | 7.5 | 150 | 9 | 57.5 | 0.45 | 4.8 |
| 6 | 17 | 1 | 1 | 9 | 100 | 10 | 60 | 0.6 | 5.45 |
| 4 | 18 | 1 | 1 | 9 | 200 | 8 | 60 | 0.6 | 5.04 |
| 11 | 19 | 1 | 1 | 6 | 200 | 8 | 65 | 0.6 | 3.49 |
| 21 | 20 | −1 | 1 | 7.5 | 150 | 7 | 62.5 | 0.45 | 3.72 |
| 12 | 21 | 1 | 1 | 9 | 200 | 8 | 65 | 0.3 | 5.39 |
| 18 | 22 | −1 | 1 | 10.5 | 150 | 9 | 62.5 | 0.45 | 3.76 |
| 22 | 23 | −1 | 1 | 7.5 | 150 | 11 | 62.5 | 0.45 | 5.1 |
| 26 | 24 | −1 | 1 | 7.5 | 150 | 9 | 62.5 | 0.75 | 4.77 |
| 19 | 25 | −1 | 1 | 7.5 | 50 | 9 | 62.5 | 0.45 | 4.02 |
| 9 | 26 | 1 | 1 | 6 | 100 | 8 | 65 | 0.3 | 3.97 |
| 30 | 27 | 0 | 1 | 7.5 | 150 | 9 | 62.5 | 0.45 | 5.47 |
| 29 | 28 | 0 | 1 | 7.5 | 150 | 9 | 62.5 | 0.45 | 5.69 |
| 13 | 29 | 1 | 1 | 6 | 100 | 10 | 65 | 0.6 | 3.85 |
| 15 | 30 | 1 | 1 | 6 | 200 | 10 | 65 | 0.3 | 5.39 |
| 16 | 31 | 1 | 1 | 9 | 200 | 10 | 65 | 0.6 | 5.46 |
| 24 | 32 | −1 | 1 | 7.5 | 150 | 9 | 67.5 | 0.45 | 4.74 |
| Std Order | Run Order | Pt Type | Blocks | Gap Current (A) | Pulse-ON Time (µs) | Pulse-OFF Time (µs) | Gap Voltage (Volt) | SCD (µm/µm2) |
|---|---|---|---|---|---|---|---|---|
| 14 | 11 | 1 | 1 | 9 | 100 | 10 | 65 | 0.0 |
| 1 | 14 | 1 | 1 | 6 | 100 | 8 | 60 | 0.063 |
| 20 | 15 | −1 | 1 | 7.5 | 250 | 9 | 62.5 | 0.04 |
| 11 | 19 | 1 | 1 | 6 | 200 | 8 | 65 | 0.044 |
| 26 | 24 | −1 | 1 | 7.5 | 150 | 9 | 62.5 | 0.065 |
| 29 | 28 | 0 | 1 | 7.5 | 150 | 9 | 62.5 | 0.051 |
| Run Order | Gap Current (A) | Pulse-ON Time (µs) | Pulse-OFF Time (µs) | Gap Voltage (Volt) | Φ | σφ (Mpa) | SDσφ (Mpa) | τφ (Mpa) | SDτφ (Mpa) |
|---|---|---|---|---|---|---|---|---|---|
| 11 | 9 | 100 | 10 | 65 | 90 | 1548.2 | 7.6 | 168.7 | 1.6 |
| 135 | 1663 | 7.6 | 168.7 | 1.6 | |||||
| 180 | 1667.4 | 7.6 | −69.7 | 1.6 | |||||
| 14 | 6 | 100 | 8 | 60 | 90 | 2223 | 11.1 | −13.7 | 2.4 |
| 135 | 2260.7 | 11.1 | 121.4 | 0 | |||||
| 180 | 2298.3 | 11.1 | 121.4 | 2.4 | |||||
| 15 | 7.5 | 250 | 9 | 62.5 | 90 | 2278.5 | 15.1 | 194 | 3.2 |
| 135 | 1973 | 15.1 | 15.5 | 3.2 | |||||
| 180 | 1778 | 15.1 | −172 | 0 |
| Algorithms | Precision Value of ‘0’ | Precision Value of ‘1’ | Recall Value of ‘0’ | Recall Value of ‘1’ | Overall F1-Score |
|---|---|---|---|---|---|
| kNN | 0.87 | 1.00 | 1.00 | 0.71 | 0.88 |
| SVM | 0.87 | 1.00 | 1.00 | 0.71 | 0.88 |
| Logistic Regression Classifier | 0.86 | 1.00 | 1.00 | 0.71 | 0.83 |
| GBN | 0.87 | 1.00 | 1.00 | 0.71 | 0.88 |
| Algorithms | Accuracy |
|---|---|
| kNN | 90 |
| SVM | 90 |
| Logistic Regression Classifier | 85 |
| GNB | 90 |
| Algorithm | Error Rate (%) | Type I Error (%) | Type II Error (%) | FPR Class 0 (%) | FNR Class 1 (%) |
|---|---|---|---|---|---|
| kNN | 10 | 6.50 | 14.50 | 13 | 29 |
| SVM | 10 | 6.50 | 14.50 | 13 | 29 |
| Logistic Regression | 15 | 7.00 | 14.50 | 14 | 29 |
| GNB | 10 | 6.50 | 14.50 | 13 | 29 |
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Kaigude, A.R.; Khedkar, N.K.; Jatti, V.S. Experimental Investigation of Surface Integrity Analysis Using Machine Learning for Nano-Powder Mixed Electrical Discharge Machining. J. Manuf. Mater. Process. 2026, 10, 115. https://doi.org/10.3390/jmmp10040115
Kaigude AR, Khedkar NK, Jatti VS. Experimental Investigation of Surface Integrity Analysis Using Machine Learning for Nano-Powder Mixed Electrical Discharge Machining. Journal of Manufacturing and Materials Processing. 2026; 10(4):115. https://doi.org/10.3390/jmmp10040115
Chicago/Turabian StyleKaigude, Amreeta R., Nitin K. Khedkar, and Vijaykumar S. Jatti. 2026. "Experimental Investigation of Surface Integrity Analysis Using Machine Learning for Nano-Powder Mixed Electrical Discharge Machining" Journal of Manufacturing and Materials Processing 10, no. 4: 115. https://doi.org/10.3390/jmmp10040115
APA StyleKaigude, A. R., Khedkar, N. K., & Jatti, V. S. (2026). Experimental Investigation of Surface Integrity Analysis Using Machine Learning for Nano-Powder Mixed Electrical Discharge Machining. Journal of Manufacturing and Materials Processing, 10(4), 115. https://doi.org/10.3390/jmmp10040115
