Stauffenberg, J.; Ortlepp, I.; Reuter, C.; Holz, M.; Dontsov, D.; Schäffel, C.; Strehle, S.; Zöllner, J.-P.; Rangelow, I.W.; Manske, E.
Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100). Proceedings 2020, 56, 34.
https://doi.org/10.3390/proceedings2020056034
AMA Style
Stauffenberg J, Ortlepp I, Reuter C, Holz M, Dontsov D, Schäffel C, Strehle S, Zöllner J-P, Rangelow IW, Manske E.
Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100). Proceedings. 2020; 56(1):34.
https://doi.org/10.3390/proceedings2020056034
Chicago/Turabian Style
Stauffenberg, Jaqueline, Ingo Ortlepp, Christoph Reuter, Mathias Holz, Denis Dontsov, Christoph Schäffel, Steffen Strehle, Jens-Peter Zöllner, Ivo W. Rangelow, and Eberhard Manske.
2020. "Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100)" Proceedings 56, no. 1: 34.
https://doi.org/10.3390/proceedings2020056034
APA Style
Stauffenberg, J., Ortlepp, I., Reuter, C., Holz, M., Dontsov, D., Schäffel, C., Strehle, S., Zöllner, J.-P., Rangelow, I. W., & Manske, E.
(2020). Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100). Proceedings, 56(1), 34.
https://doi.org/10.3390/proceedings2020056034
