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Proceedings 2018, 2(13), 1034; https://doi.org/10.3390/proceedings2131034

Surface Plasmon Resonances in Sn: In2O3 Thin Films with Diffraction Grating

1
Department of Electronics, Kyoto Institute of Technology, Kyoto 606-8585, Japan
2
WaferMaters, Inc., Dublin, CA 94568, USA
Presented at the Eurosensors 2018 Conference, Graz, Austria, 9–12 September 2018.
*
Author to whom correspondence should be addressed.
Published: 9 November 2018
PDF [693 KB, uploaded 9 November 2018]

Abstract

We newly proposed transparent conductive oxide with diffraction grating structure as an excitation field of surface plasmon resonance working at near-infrared spectral region. We experimentally demonstrated the excitation of SPR using Sn-doped In2O3 films with micro-meter pitched diffraction grating. In this study, we considered the correlation between the grating pitch and the optical reflection spectra. Reflection spectra showed clear polarization properties in infrared spectral region, and the reflection edge has also correlation with the pitch of grating. From these results, the excitation of SPR grating was successfully demonstrated and the wavelength can be tuned by changing the grating pitch in infrared region.
Keywords: surface plasmon resonance; Indium Tin Oxide (ITO); diffraction grating surface plasmon resonance; Indium Tin Oxide (ITO); diffraction grating
This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
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Hasuike, N.; Ochiai, S.; Iwakiri, R.; Takeda, M.; Yoo, W.S.; Isshiki, T. Surface Plasmon Resonances in Sn: In2O3 Thin Films with Diffraction Grating. Proceedings 2018, 2, 1034.

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