Szypłowska, A.; Lewandowski, A.; Wilczek, A.; Kafarski, M.; Szerement, J.; Skierucha, W.
Soil Dielectric-Spectrum Characterization Based on One-Port VNA Measurement System. Proceedings 2017, 1, 811.
https://doi.org/10.3390/proceedings1080811
AMA Style
Szypłowska A, Lewandowski A, Wilczek A, Kafarski M, Szerement J, Skierucha W.
Soil Dielectric-Spectrum Characterization Based on One-Port VNA Measurement System. Proceedings. 2017; 1(8):811.
https://doi.org/10.3390/proceedings1080811
Chicago/Turabian Style
Szypłowska, Agnieszka, Arkadiusz Lewandowski, Andrzej Wilczek, Marcin Kafarski, Justyna Szerement, and Wojciech Skierucha.
2017. "Soil Dielectric-Spectrum Characterization Based on One-Port VNA Measurement System" Proceedings 1, no. 8: 811.
https://doi.org/10.3390/proceedings1080811
APA Style
Szypłowska, A., Lewandowski, A., Wilczek, A., Kafarski, M., Szerement, J., & Skierucha, W.
(2017). Soil Dielectric-Spectrum Characterization Based on One-Port VNA Measurement System. Proceedings, 1(8), 811.
https://doi.org/10.3390/proceedings1080811