Analysis on Chattering Phenomena by the Tilt of the Proof Mass in MEMS Switch †
Abstract
:1. Introduction
2. Analysis Methods
3. Results
4. Discussion
5. Conclusions
Conflicts of Interest
References
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Proof mass [kg] (w × l × t) [μm3] | 3.07 × 10−7 (910 × 910 × 200) |
Spring constant [N/m] | 4.5 |
Initial gap [μm] | 6.5 |
Input force [N] | 3.61× 10-5 |
Coefficient of Restitution | 0.1/0.3/0.5 |
Vertical height between center and end of the proof mass ( − ) [μm] | 1/2/3 |
Tilted angle [°] | 1.14/2.29/3.43 |
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Hwang, J.-M.; Hwang, J.; Ryu, D.; Jang, S.-G.; Kim, Y.-K. Analysis on Chattering Phenomena by the Tilt of the Proof Mass in MEMS Switch. Proceedings 2017, 1, 349. https://doi.org/10.3390/proceedings1040349
Hwang J-M, Hwang J, Ryu D, Jang S-G, Kim Y-K. Analysis on Chattering Phenomena by the Tilt of the Proof Mass in MEMS Switch. Proceedings. 2017; 1(4):349. https://doi.org/10.3390/proceedings1040349
Chicago/Turabian StyleHwang, Jung-Min, Jeongki Hwang, Daeho Ryu, Seung-Gyo Jang, and Yong-Kweon Kim. 2017. "Analysis on Chattering Phenomena by the Tilt of the Proof Mass in MEMS Switch" Proceedings 1, no. 4: 349. https://doi.org/10.3390/proceedings1040349
APA StyleHwang, J. -M., Hwang, J., Ryu, D., Jang, S. -G., & Kim, Y. -K. (2017). Analysis on Chattering Phenomena by the Tilt of the Proof Mass in MEMS Switch. Proceedings, 1(4), 349. https://doi.org/10.3390/proceedings1040349