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High-Precision X-ray Total Scattering Measurements Using a High-Accuracy Detector System

High-Sensitivity X-ray Phase Imaging System Based on a Hartmann Wavefront Sensor

Laboratoire d’Optique Appliquée, ENSTA ParisTech, CNRS, Ecole Polytechnique, 828 Boulevard des Maréchaux, 91120 Palaiseau, France
Institute of Nanotechnology, CNR Nanotec, Department of Physics, Sapienza University, Piazzale Aldo Moro 5, 00185 Rome, Italy
Imagine Optic, Bordeaux Office, Rue François Mitterrand, 33400 Talence, France
Imagine Optic, 18, Rue Charles de Gaulle, 91400 Orsay, France
Author to whom correspondence should be addressed.
Academic Editor: Alessandro Scordo
Condens. Matter 2022, 7(1), 3;
Received: 15 November 2021 / Revised: 23 December 2021 / Accepted: 24 December 2021 / Published: 27 December 2021
(This article belongs to the Special Issue High Precision X-ray Measurements 2021)
The Hartman wavefront sensor can be used for X-ray phase imaging with high angular resolution. The Hartmann sensor is able to retrieve both the phase and absorption from a single acquisition. The system calculates the shift in a series of apertures imaged with a detector with respect to their reference positions. In this article, the impact of the reference image on the final image quality is investigated using a laboratory setup. Deflection and absorption images of the same sample are compared using reference images acquired in air and in water. It can be easily coupled with tomographic setups to obtain 3D images of both phase and absorption. Tomographic images of a test sample are shown, where deflection images revealed details that were invisible in absorption. The findings reported in this paper can be used for the improvement of image reconstruction and for expanding the applications of X-ray phase imaging towards materials characterization and medical imaging. View Full-Text
Keywords: phase imaging; Hartmann sensor; tomography; X-rays phase imaging; Hartmann sensor; tomography; X-rays
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MDPI and ACS Style

Begani Provinciali, G.; Piponnier, M.; Oudjedi, L.; Levecq, X.; Harms, F.; Cedola, A.; de La Rochefoucauld, O.; Zeitoun, P. High-Sensitivity X-ray Phase Imaging System Based on a Hartmann Wavefront Sensor. Condens. Matter 2022, 7, 3.

AMA Style

Begani Provinciali G, Piponnier M, Oudjedi L, Levecq X, Harms F, Cedola A, de La Rochefoucauld O, Zeitoun P. High-Sensitivity X-ray Phase Imaging System Based on a Hartmann Wavefront Sensor. Condensed Matter. 2022; 7(1):3.

Chicago/Turabian Style

Begani Provinciali, Ginevra, Martin Piponnier, Laura Oudjedi, Xavier Levecq, Fabrice Harms, Alessia Cedola, Ombeline de La Rochefoucauld, and Philippe Zeitoun. 2022. "High-Sensitivity X-ray Phase Imaging System Based on a Hartmann Wavefront Sensor" Condensed Matter 7, no. 1: 3.

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