Next Article in Journal
Tricolor Technique for Visualization of Spatial Variations of Polydisperse Dust in Gas-Dust Flows
Next Article in Special Issue
Improved Reconstruction Technique for Moiré Imaging Using an X-Ray Phase-Contrast Talbot–Lau Interferometer
Previous Article in Journal
Cerebral Hemodynamic Influences in Task-Related Functional Magnetic Resonance Imaging and Near-Infrared Spectroscopy in Acute Sport-Related Concussion: A Review
Previous Article in Special Issue
Non-Destructive Testing of Archaeological Findings by Grating-Based X-Ray Phase-Contrast and Dark-Field Imaging
Article Menu
Issue 5 (May) cover image

Export Article

Version is current.

Open AccessReview
J. Imaging 2018, 4(5), 60; https://doi.org/10.3390/jimaging4050060

State of the Art of X-ray Speckle-Based Phase-Contrast and Dark-Field Imaging

1
Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, UK
2
Department of Physics & Astronomy, University College London, London WC1E 6BT, UK
Received: 24 March 2018 / Revised: 13 April 2018 / Accepted: 17 April 2018 / Published: 25 April 2018
(This article belongs to the Special Issue Phase-Contrast and Dark-Field Imaging)
Full-Text   |   PDF [10943 KB, uploaded 3 May 2018]   |  

Abstract

In the past few years, X-ray phase-contrast and dark-field imaging have evolved to be invaluable tools for non-destructive sample visualisation, delivering information inaccessible by conventional absorption imaging. X-ray phase-sensing techniques are furthermore increasingly used for at-wavelength metrology and optics characterisation. One of the latest additions to the group of differential phase-contrast methods is the X-ray speckle-based technique. It has drawn significant attention due to its simple and flexible experimental arrangement, cost-effectiveness and multimodal character, amongst others. Since its first demonstration at highly brilliant synchrotron sources, the method has seen rapid development, including the translation to polychromatic laboratory sources and extension to higher-energy X-rays. Recently, different advanced acquisition schemes have been proposed to tackle some of the main limitations of previous implementations. Current applications of the speckle-based method range from optics characterisation and wavefront measurement to biomedical imaging and materials science. This review provides an overview of the state of the art of the X-ray speckle-based technique. Its basic principles and different experimental implementations as well as the the latest advances and applications are illustrated. In the end, an outlook for anticipated future developments of this promising technique is given. View Full-Text
Keywords: X-ray speckle-based imaging; X-ray near-field speckle; X-ray phase-contrast imaging; X-ray dark-field imaging; X-ray multimodal imaging; X-ray phase tomography; X-ray wavefront sensing; metrology; optics characterisation X-ray speckle-based imaging; X-ray near-field speckle; X-ray phase-contrast imaging; X-ray dark-field imaging; X-ray multimodal imaging; X-ray phase tomography; X-ray wavefront sensing; metrology; optics characterisation
Figures

Figure 1

This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
SciFeed

Share & Cite This Article

MDPI and ACS Style

Zdora, M.-C. State of the Art of X-ray Speckle-Based Phase-Contrast and Dark-Field Imaging. J. Imaging 2018, 4, 60.

Show more citation formats Show less citations formats

Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Related Articles

Article Metrics

Article Access Statistics

1

Comments

[Return to top]
J. Imaging EISSN 2313-433X Published by MDPI AG, Basel, Switzerland RSS E-Mail Table of Contents Alert
Back to Top