Grabow, J.; Klink, J.; Benger, R.; Hauer, I.; Beck, H.-P.
Particle Contamination in Commercial Lithium-Ion Cells—Risk Assessment with Focus on Internal Short Circuits and Replication by Currently Discussed Trigger Methods. Batteries 2023, 9, 9.
https://doi.org/10.3390/batteries9010009
AMA Style
Grabow J, Klink J, Benger R, Hauer I, Beck H-P.
Particle Contamination in Commercial Lithium-Ion Cells—Risk Assessment with Focus on Internal Short Circuits and Replication by Currently Discussed Trigger Methods. Batteries. 2023; 9(1):9.
https://doi.org/10.3390/batteries9010009
Chicago/Turabian Style
Grabow, Jens, Jacob Klink, Ralf Benger, Ines Hauer, and Hans-Peter Beck.
2023. "Particle Contamination in Commercial Lithium-Ion Cells—Risk Assessment with Focus on Internal Short Circuits and Replication by Currently Discussed Trigger Methods" Batteries 9, no. 1: 9.
https://doi.org/10.3390/batteries9010009
APA Style
Grabow, J., Klink, J., Benger, R., Hauer, I., & Beck, H.-P.
(2023). Particle Contamination in Commercial Lithium-Ion Cells—Risk Assessment with Focus on Internal Short Circuits and Replication by Currently Discussed Trigger Methods. Batteries, 9(1), 9.
https://doi.org/10.3390/batteries9010009