Möller, S.; Joo, H.; Rasinski, M.; Mann, M.; Figgemeier, E.; Finsterbusch, M.
Quantitative Lithiation Depth Profiling in Silicon Containing Anodes Investigated by Ion Beam Analysis. Batteries 2022, 8, 14.
https://doi.org/10.3390/batteries8020014
AMA Style
Möller S, Joo H, Rasinski M, Mann M, Figgemeier E, Finsterbusch M.
Quantitative Lithiation Depth Profiling in Silicon Containing Anodes Investigated by Ion Beam Analysis. Batteries. 2022; 8(2):14.
https://doi.org/10.3390/batteries8020014
Chicago/Turabian Style
Möller, Sören, Hyunsang Joo, Marcin Rasinski, Markus Mann, Egbert Figgemeier, and Martin Finsterbusch.
2022. "Quantitative Lithiation Depth Profiling in Silicon Containing Anodes Investigated by Ion Beam Analysis" Batteries 8, no. 2: 14.
https://doi.org/10.3390/batteries8020014
APA Style
Möller, S., Joo, H., Rasinski, M., Mann, M., Figgemeier, E., & Finsterbusch, M.
(2022). Quantitative Lithiation Depth Profiling in Silicon Containing Anodes Investigated by Ion Beam Analysis. Batteries, 8(2), 14.
https://doi.org/10.3390/batteries8020014