Article Versions Notes

Li H, Zhang Z, Nian H, Chen Z, Jiang S, Ding F, Sun D, Lin H. Application of Terahertz Detection Technology in Non-Destructive Thickness Measurement. Photonics. 2025; 12(12):1191. https://doi.org/10.3390/photonics12121191

Li, Hongkai, Zichen Zhang, Hongkai Nian, Zhixuan Chen, Shichuang Jiang, Fan Ding, Dong Sun, and Hongyi Lin. 2025. "Application of Terahertz Detection Technology in Non-Destructive Thickness Measurement" Photonics 12, no. 12: 1191. https://doi.org/10.3390/photonics12121191

Li, H., Zhang, Z., Nian, H., Chen, Z., Jiang, S., Ding, F., Sun, D., & Lin, H. (2025). Application of Terahertz Detection Technology in Non-Destructive Thickness Measurement. Photonics, 12(12), 1191. https://doi.org/10.3390/photonics12121191