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Journal: Processes, 2022
Volume: 10
Number: 497

Article: A Novel Fault Detection Scheme Based on Mutual k-Nearest Neighbor Method: Application on the Industrial Processes with Outliers
Authors: by Jian Wang, Zhe Zhou, Zuxin Li and Shuxin Du
Link: https://www.mdpi.com/2227-9717/10/3/497

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