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Journal: Mathematics, 2020
Volume: 8
Number: 857
Article:
Outliers Detection Models in Shewhart Control Charts; an Application in Photolithography: A Semiconductor Manufacturing Industry
Authors:
by
Ishaq Adeyanju Raji, Muhammad Hisyam Lee, Muhammad Riaz, Mu’azu Ramat Abujiya and Nasir Abbas
Link:
https://www.mdpi.com/2227-7390/8/5/857
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