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Journal: Mathematics, 2026
Volume: 14
Number: 1973

Article: SLA-YOLO—Enhancing YOLO for Tiny Defect Detection in Industrial Defect Scenes
Authors: by Yanxia Lyu, Xinqi Wang, Chenyu Jin, Yuanhong Wei and Zhenyu Sun
Link: https://www.mdpi.com/2227-7390/14/11/1973

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