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Technologies 2017, 5(2), 27;

Maxwell–Wagner Effect in Multi-Layered Dielectrics: Interfacial Charge Measurement and Modelling

Electrical Engineering Department, Electric Power University, 235 Hoang Quoc Viet, Hanoi 10000, Vietnam
Laboratory on Plasma and Conversion of Energy (LAPLACE), Université de Toulouse, CNRS, INPT, UPS, Bat 3R3, 118, route de Narbonne, 31062 Toulouse, France
Author to whom correspondence should be addressed.
Academic Editor: Manoj Gupta
Received: 11 April 2017 / Revised: 12 May 2017 / Accepted: 25 May 2017 / Published: 29 May 2017
(This article belongs to the Section Innovations in Materials Processing)
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The development of high voltage direct current (HVDC) technologies generates new paradigms in research. In particular and contrary to the AC case, investigation of electrical conduction is not only needed for understanding the dielectric breakdown but also to describe the field distribution inside the insulation. Here, we revisit the so-called Maxwell–Wagner effect in multi-layered dielectrics by considering on the one hand a non-linear field dependent model of conductivity and on the other hand by performing space charge measurements giving access to the interfacial charge accumulated between different dielectrics. We show that space charge measurements give access to the amount of interfacial charge built-up by the Maxwell–Wagner effect between two dielectrics of different natures. Measurements also demonstrate that the field distribution undergoes a transition from a capacitive distribution to a resistive one, under long lasting stress. View Full-Text
Keywords: interfacial charge; Maxwell–Wagner effect; space charge; HVDC; XLPE interfacial charge; Maxwell–Wagner effect; space charge; HVDC; XLPE

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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).

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Vu, T.T.N.; Teyssedre, G.; Roy, S.L.; Laurent, C. Maxwell–Wagner Effect in Multi-Layered Dielectrics: Interfacial Charge Measurement and Modelling. Technologies 2017, 5, 27.

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