Galloway, K.F.; Witulski, A.F.; Schrimpf, R.D.; Sternberg, A.L.; Ball, D.R.; Javanainen, A.; Reed, R.A.; Sierawski, B.D.; Lauenstein, J.-M.
Failure Estimates for SiC Power MOSFETs in Space Electronics. Aerospace 2018, 5, 67.
https://doi.org/10.3390/aerospace5030067
AMA Style
Galloway KF, Witulski AF, Schrimpf RD, Sternberg AL, Ball DR, Javanainen A, Reed RA, Sierawski BD, Lauenstein J-M.
Failure Estimates for SiC Power MOSFETs in Space Electronics. Aerospace. 2018; 5(3):67.
https://doi.org/10.3390/aerospace5030067
Chicago/Turabian Style
Galloway, Kenneth F., Arthur F. Witulski, Ronald D. Schrimpf, Andrew L. Sternberg, Dennis R. Ball, Arto Javanainen, Robert A. Reed, Brian D. Sierawski, and Jean-Marie Lauenstein.
2018. "Failure Estimates for SiC Power MOSFETs in Space Electronics" Aerospace 5, no. 3: 67.
https://doi.org/10.3390/aerospace5030067
APA Style
Galloway, K. F., Witulski, A. F., Schrimpf, R. D., Sternberg, A. L., Ball, D. R., Javanainen, A., Reed, R. A., Sierawski, B. D., & Lauenstein, J.-M.
(2018). Failure Estimates for SiC Power MOSFETs in Space Electronics. Aerospace, 5(3), 67.
https://doi.org/10.3390/aerospace5030067