Li, X.; Bai, X.; Wu, L.; Wang, C.; Liu, X.; Li, Q.; Zhang, X.; Chen, F.; Lu, C.; Gao, W.;
et al. Mapping of a Quantitative Trait Locus for Stay-Green Trait in Common Wheat. Plants 2025, 14, 727.
https://doi.org/10.3390/plants14050727
AMA Style
Li X, Bai X, Wu L, Wang C, Liu X, Li Q, Zhang X, Chen F, Lu C, Gao W,
et al. Mapping of a Quantitative Trait Locus for Stay-Green Trait in Common Wheat. Plants. 2025; 14(5):727.
https://doi.org/10.3390/plants14050727
Chicago/Turabian Style
Li, Xin, Xin Bai, Lijuan Wu, Congya Wang, Xinghui Liu, Qiqi Li, Xiaojun Zhang, Fang Chen, Chengda Lu, Wei Gao,
and et al. 2025. "Mapping of a Quantitative Trait Locus for Stay-Green Trait in Common Wheat" Plants 14, no. 5: 727.
https://doi.org/10.3390/plants14050727
APA Style
Li, X., Bai, X., Wu, L., Wang, C., Liu, X., Li, Q., Zhang, X., Chen, F., Lu, C., Gao, W., & Cheng, T.
(2025). Mapping of a Quantitative Trait Locus for Stay-Green Trait in Common Wheat. Plants, 14(5), 727.
https://doi.org/10.3390/plants14050727