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Journal: Electronics, 2020
Volume: 9
Number: 864

Article: Programming Pulse Width Assessment for Reliable and Low-Energy Endurance Performance in Al:HfO2-Based RRAM Arrays
Authors: by Eduardo Pérez, Óscar González Ossorio, Salvador Dueñas, Helena Castán, Héctor García and Christian Wenger
Link: https://www.mdpi.com/2079-9292/9/5/864

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