Error-Vulnerable Pattern-Aware Binary-to-Ternary Data Mapping for Improving Storage Density of 3LC Phase Change Memory
Round 1
Reviewer 1 Report
Multi-level-cell phase-change memory is a interesting topic and can potentially boost the current memory market to another level. This paper is helpful to the researchers in this area. A reference to GST material can help the readers to quickly understand this memory from fundamental side.
Author Response
Please see the attachment.
Author Response File: Author Response.pdf
Reviewer 2 Report
I think this manuscript is a good job. The only improvement, which is essential, is to compare it with a very recent reference, making a comparative analysis, even if it is theoretical of what is proposed and of the results presented, with respect to the results of this work.
The reference is:
T. Kwon, M. Imran and J. Yang, "Cost-Effective Reliable MLC PCM Architecture Using Virtual Data Based Error Correction," in IEEE Access, vol. 8, pp. 44006-44018, 2020.
Author Response
Please see the attachment.
Author Response File: Author Response.pdf
Round 2
Reviewer 2 Report
Nice work!!!